Table of contents and Foreword

Abstract

This issue of Journal of Integrated Circuits and Systems (JICS) includes 6 papers on design, test and CAD. These papers have been selected from the presentations given at SBCCI2006 (Symposium on Integrated Circuits and Systems Design), which was organized in Ouro Preto, Brazil in 2006. Among the contributions presented at SBCCI2006 conference, only a few were selected by the Technical Committee for this issue. These papers have been submitted to usual reviewing process with the help of external experts. We would like to thank the authors for their effort in preparing these high quality papers, as well as the reviewers for their help on paper selection which guarantees the scientic level of this issue.We sincerely hope that JICS readers will enjoy these contributions, as we have enjoyed listening to them at the SBCCI2006 conference. 

The Editors.