New March Elements for Address Decoder Open and Resistive Open Fault Detection in SRAMs

Authors

  • L. Dilillo
  • P. Girard
  • S. Pravossoudovitch
  • A. Virazel
  • S. Borri
  • M. Bastian

DOI:

https://doi.org/10.29292/jics.v3i1.276

Keywords:

Memory testing, address decoder, dynamic faults, open and resistive-open defects

Abstract

This paper presents a complete analysis of the ability of March tests to detect ADOFs (Address Decoder Open Faults) and resistive-ADOFs in address decoders of embedded-SRAMs. Such faults are the primary target of this study because they are notoriously hard-to-detect. With this study, we show that standard March tests without modifications are not able to detect them and we propose to translate the algorithm presented in [1, 2] into March elements. These new March elements involve a particular address sequence and data to be written. For this purpose, we have exploited some Degrees of Freedom of the March tests (DOF I and IV) in order to generate these new March elements for ADOFs detection. Compared to the previous March solutions, these new March elements ensure the fault observation.

Additional Files

Published

2020-11-18