Testing a Fault Tolerant Mixed-Signal Design Under TID and Heavy Ions

Authors

  • Carlos J Gonzalez Federal University of Rio Grande do Sul (UFRGS) - Brazil
  • Diego Machado Federal University of Rio Grande do Sul (UFRGS) - Brazil
  • Rafael G Vaz Institute for Advanced Studies (IEAv) - Brazil
  • Alexis C Vilas Bôas University Center of FEI - Brazil
  • Odair L Gonçalez Institute for Advanced Studies (IEAv) - Brazil
  • Helmut Puchner Infineon Memory Solution - USA
  • Nemitala Added
  • Eduardo L. A. Macchione University of São Paulo (USP) - Brazil
  • Vitor A. P Aguiar University of São Paulo (USP) - Brazil
  • Fernanda L. Kastensmidt Federal University of Rio Grande do Sul (UFRGS) - Brazil
  • Nilberto H. Medina University of São Paulo (USP) - Brazil
  • Marcilei A. Guazzelli University Center of FEI - Brazil
  • Tiago R. Balen Federal University of Rio Grande do Sul (UFRGS) - Brazil

DOI:

https://doi.org/10.29292/jics.v16i3.567

Keywords:

Design Diversity Redundancy, Mixed-Signal, Radiation, Single Events, Soft Errors, Fault Tolerance, Analog-to-Digital Converters, Programmable device, PSoC

Abstract

This work presents results of three distinct radiation tests performed upon a fault-tolerant data acquisition system comprising a design diversity redundancy technique. The first and second experiments are Total Ionizing Dose (TID) essays, comprising gamma and X-ray irradiations. The last experiment considers single event effects, in which two heavy ion irradiation campaigns are carried out. The case study system comprises three analog-to-digital converters and two software-based voters, besides additional software and hardware resources used for controlling, monitoring and memory management. The applied Diversity Triple Modular Redundancy (DTMR) technique, comprises different levels of diversity (temporal and architectural). The circuit was designed in a programmable System-on-Chip (PSoC), fabricated in a 130nm CMOS technology process. Results show that the technique may increase the lifetime of the system under TID if comparing with a non-redundant implementation. Considering the heavy ions experiments the system was proved effective to tolerate 100% of the observed errors originated in the converters, while errors in the processing unit present a higher criticality. Critical errors occurring in one of the voters were also observed. A second heavy-ion campaign was then carried out to investigate the voters reliability, comparing the dynamic cross-section of three different software-based voter schemes implemented in the considered PSoC. 

Additional Files

Published

2021-12-31

Issue

Section

Special Issue on Hardware and Software Fault Tolerance