Guest Editors' Words
DOI:
https://doi.org/10.29292/jics.v16i3.575Keywords:
Radiation effects, Reliability, Fault tolerance, Mitigation techniques, Radiation testing, Qualification of integrated circuitsAbstract
This Special Issues brings four invited papers that describe the state of the art techniques to improve fault tolerance on complex designs. Integrated circuits operating under radiation can experience undesirable faults that must be evaluated and mitigated. Mitigation can be implemented by redundancy in hardware or in software, and by selecting and protecting the most critical parts of the system. Radiation effects test and analysis also play an important step in identifying the criticality of the system and helping designers to better apply fault mitigation techniques.
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