Guest Editors' Words

Authors

  • Fernanda Lima Kastensmidt Federal University of Rio Grande do Sul (UFRGS) - Brazil
  • Sergio Cuenca Asensi Universidad de Alicante - Spain

DOI:

https://doi.org/10.29292/jics.v16i3.575

Keywords:

Radiation effects, Reliability, Fault tolerance, Mitigation techniques, Radiation testing, Qualification of integrated circuits

Abstract

This Special Issues brings four invited papers that describe the state of the art techniques to improve fault tolerance on complex designs. Integrated circuits operating under radiation can experience undesirable faults that must be evaluated and mitigated. Mitigation can be implemented by redundancy in hardware or in software, and by selecting and protecting the most critical parts of the system.  Radiation effects test and analysis also play an important step in identifying the criticality of the system and helping designers to better apply fault mitigation techniques.

Additional Files

Published

2022-02-03 — Updated on 2022-02-03

Versions

Issue

Section

Special Issue on Hardware and Software Fault Tolerance