Vol. 4 No. 2 (2009): Journal of Integrated Circuits and Systems

João Antonio Martino Marcelo Lubaszewski

JICS Editor-in-chief JICS Co-Editor

Printed ISSN: 1807-1953

DOI: https://doi.org/10.29292/jics.v4i2

Published: 2009-09-01

Regular Papers

Table of Contents and Foreword

João Antonio Martino, Marcelo Lubaszewski

46 - 50
- PDF
A Review of SOI Technology and its Applications

Bich-Yen Nguyen, George Celler, Carlos Mazuré

51 - 54
- PDF
Mobility Modeling in Advanced MOSFETs with Ultra-Thin Silicon Body under Stress

Viktor A. Sverdlov, Thomas Windbacher, Franz Schanovsky, Siegfried Selberherr

55 - 60
- PDF
Investigation of the Gate Length and Drain Bias Dependence of the ZTC Biasing Point Instability of N- and P-Channel PD SOI MOSFETs

Luciano Mendes Camillo, João Antonio Martino, Eddy Simoen, Cor Claeys

61 - 66
- PDF
Analysis of Electromigration in Dual-Damascene Interconnect Structures

Roberto Lacerda de Orio, Hajdin Ceric, Siegfried Selberherr

67 - 72
- PDF
Waferlevel Vacuum Packaged Microscanners: A High Yield Fabrication Process for Mobile Applications

Marten Oldsen, Ulrich Hofmann, Joachim Janes, Hans-Joachim Quenzer, Bernd Wagner

73 - 78
- PDF
Preparation and Characterization of Electrodeposited Co/p-Si Schottky Diodes

R. Zandonay, R. G. Delatorre, A. A. Pasa

79 - 83
- PDF
Time-of-Flight Flow Microsensor using Free-Standing Microfilaments

Roberto Jacobe Rodrigues, Rogério Furlan

84 - 88
- PDF