Vol. 8 No. 2 (2013): Journal of Integrated Circuits and Systems

Marcelo Antonio Pavanello Fernando Gehm Moraes

JICS Editor-in-chief JICS Co-Editor

Printed ISSN: 1807-1953

DOI: https://doi.org/10.29292/jics.v8i2

Published: 2013-09-01

Regular Papers

Table of Contents and Foreword

Marcelo Antonio Pavanello, Fernando Gehm Moraes

64 - 70
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On the Variability of the Low-Frequency Noise in UTBOX SOI nMOS-FETs

Eddy Simoen, Maria G. C. Andrade, Luciano M. Almeida, M. Aoulaiche, C. Caillat, M. Jurczak, Cor Claeys

71 - 77
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Reliability Concerns due to Self-Heating effects in GaN HEMTs

B. Padmanabhan, D. Vasileska, S. M. Goodnick

78 - 82
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Pressure Sensor Systems for Wide Pressure Ranges Integrated by a Combined CMOS- and MEMS- Technology

Wolfgang Schreiber-Prillwitz, Reinhart Job

83 - 88
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Detection of Transient Faults in Nanometer Technologies by using Modular Built-In Current Sensors

Frank Sill Torres, Rodrigo Possamai Bastos

89 - 97
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A Novel Pseudo NMOS Integrated CC -ISFET Device for Water Quality Monitoring

Pawan Whig, Syed Naseem Ahmad

98 - 103
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Selective and Anisotropic Dry Etching of Ge over Si

Marcelo S. B. Castro, Sebastien Barnola, Barbara Glück

104 - 109
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Nanowire Tunnel Field Effect Transistors at High Temperature

Márcio D. V. Martino, Felipe S. Neves, Paula Ghedini Der Agopian, João Antonio Martino, Rita Rooyackers, Cor Claeys

110 - 115
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Drain Current and Short Channel Effects Modeling in Junctionless Nanowire Transistors

Renan D. Trevisoli, Rodrigo T. Doria, Michelly de Souza, Marcelo Antonio Pavanello

116 - 124
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