Vol. 1 No. 2 (2004): Journal of Integrated Circuits and Systems

Ricardo Reis Pascal Fouillat & Fernando Moraes

JICS Editor-in-chief JICS Co-Editors

Printed ISSN: 1807-1953

DOI: https://doi.org/10.29292/jics.v1i2

Published: 2004-06-01

Regular Papers

Table of contents and Foreword

Ricardo Reis, Fernando Moraes, Pascal Fouillat

1 - 4
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Study of Power Balance in Electronegative Capacitively Coupled Plasmas

Laura Swart, Patrick Verdonck, Stanislav A. Moshkalev

5 - 12
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Simulations of Silicon Microstructure for Preconcentration of Metallic Ions

J. A. Fracassi da Silva, R. Furlan, E. W. Simões, M. L. P. da Silva, M. T. Pereira

13 - 16
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Analysis of Defects Generated by the Reflow Soldering in SMT (Surface Mount Technology) Assembly Applying the Six Sigma Method

Ana C. Bueno, Maíra P. Shiki, Valdemir R. de Lima, Luis G. Brandão, Maurício M. Oka

17 - 25
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In-Situ and Ion Implantation Nitrogen Doping on Near Stoichiometric a-SiC:H Films

A. R. Oliveira, M. N. P. Carreño

26 - 30
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Study of the Drain Leakage Current Behavior in Graded-Channel SOI nMOSFETs Operating at High Temperatures

Marcello Bellodi, João Antonio Martino

31 - 35
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Conductance of Single- and Double-Gated Quantum Stub Transistor

Alexandre B. Guerra, Edval J. P. Santos

36 - 40
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The Effect of Nitrogen Concentration at Oxynitride Gate Insulators Formed by 28N2 + Implantation into Silicon with Additional Conventional or Rapid Thermal Oxidation

A. G. Felício, José Alexandre Diniz, J. Godoy Fo., I. Doi, M. A. A. Pudenzi, Jacobus W. Swart

41 - 47
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